[Home ] [Archive]    
:: Main :: About :: Current Issue :: Archive :: Search :: Submit :: Contact ::
:: Volume 18, Issue 2 (4-2020) ::
Int J Radiat Res 2020, 18(2): 263-274 Back to browse issues page
Experimental and theoretical investigation into X-ray shielding properties of thin lead films
M. Vagheian , D. Sardari, S. Saramad, D. Rezaei Ochbelagh
Tehran Polytechnic University (Amirkabir University of Technology), Tehran, Iran , mehran.vagheian@gmail.com
Abstract:   (1516 Views)
Background: Among all of the radiations, X-ray has been always the center of attention due to the increasing availability of the X-ray tubes in industry, research institutes and medical centers. In this study, X-ray shielding properties of bulk and nanostructured thin lead films were investigated by means of Monte-Carlo computational and experimental methods, respectively. Materials and Methods: The lead samples were fabricated by the Physical Vapor Deposition technique (PVD) with different thickness of 10, 100 and 1000 nm. To investigate the radiation shielding properties of the nanostructured thin films, all of the prepared samples were subjected to the X-ray ranging from 8 to 14 keV. In order to consider the shielding properties of the bulk-structured thin films, the Monte-Carlo MCNPX code was employed. Results: The results indicated that, for low X-ray energies, the nanostructured thin lead films attenuate more than bulk-structured samples; however, the difference disappears as film thickness increases to 1000 nm or X-ray energy reaches 14 keV. Conclusion: Results imply that the nanostructured thin lead films attenuate more photons than the bulk-structured thin lead films with the same thicknesses.
Keywords: Nanostructured thin lead films, Advanced X-ray shielding design, MCNPX code, Thin lead film characterization.
Full-Text [PDF 2507 kb]   (612 Downloads)    
Type of Study: Original Research | Subject: Medical Physics
Send email to the article author

Add your comments about this article
Your username or Email:


XML     Print

Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Vagheian M, Sardari D, Saramad S, Rezaei Ochbelagh D. Experimental and theoretical investigation into X-ray shielding properties of thin lead films. Int J Radiat Res. 2020; 18 (2) :263-274
URL: http://ijrr.com/article-1-2886-en.html

Rights and permissions
Creative Commons License This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.
Volume 18, Issue 2 (4-2020) Back to browse issues page
International Journal of Radiation Research
Persian site map - English site map - Created in 0.04 seconds with 32 queries by YEKTAWEB 4343